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PRODUCT INFORMATION
Overview
Double Beam UV-Vis Spectrophotometer LT-DUV304 with 0.1 to 5 nm adjustable bandwidth supports detailed optical measurement workflows. Operators prepare samples, configure analysis settings through software, and perform calibration before testing. Sample readings are collected and reviewed throughout the run for accurate evaluation. Measurement data can be examined, compared, and saved for reporting, maintaining an organized process from sample loading through final data assessment.
Technical Specifications
| Light Source | Deuterium & Tungsten Lamps | Optical System | Double Beam Design |
|---|---|---|---|
| Wavelength Range | 190–1100 nm | Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ±0.3 nm | Stray Light | ≤0.02%T |
| Photometric Range | −4 to 4 Abs | Photometric Accuracy | ±0.2%T |
| Photometric Repeatability | ≤0.15%T | Stability | ±0.001A/h |
| Detector | High-Sensitivity Photomultiplier | Display | Color Touch Screen |
| Cell Holder | Multi-Cell Holder | PC Interface | USB Connectivity |
| Power Supply | AC 220V / 50Hz | Dimensions (L×W×H) | 650 × 500 × 280 mm |
| Net Weight | 26 kg | Gross Weight | 30 kg |
PRODUCT DETAILS
Features & Applications
PRODUCT BENEFITS
Key Features
High Sensitivity Detection
Research-Level Analysis
Adjustable Measurement Settings
Advanced Optical Performance
Software-Controlled Operation
Comprehensive Data Evaluation
WHERE IT IS USED
Applications
High Sensitivity Analysis: Detect low-level signals.
Spectrum Scanning: Assess spectral characteristics.
Bandwidth Adjustment: Optimize measurements.
Quantitative Analysis: Generate sample data.
Result Verification: Compare sample readings.
Data Processing: Review and store results.
PRODUCT INFORMATION
Product Details
DOUBLE BEAM UV-VIS SPECTROPHOTOMETER