Overview
X-ray Fluorescence Spectrometer LT-XRF101 offers an elemental analysis range from Fluorine (F) to Uranium (U). It is equipped with a large-area graphene ultra-thin window, electrically cooled semiconductor SDD detector. It features AI-based sample recognition, ensuring fast and accurate detection with a fully matched analysis mode that completes sample detection in a single action. Controlled by a Siemens PLC, the instrument supports 9-sample, 12-sample, and 20-sample chamber configurations. The software enables seamless dual-gas path switching, overcoming the limitations of conventional XRF systems in measuring light elements in liquids.
Technical Specifications
| Elemental Analysis | Fluorine (F) to Uranium (U) | Analytical Range | 99.99% |
|---|---|---|---|
| Analytical Accuracy | <0.05% | RSD value | >96% |
| Analytical Detection | 0.2 ppm (for light matrices) | Detector Energy Resolution | SDD detector, ≤129eV |
| Temperature Range | 15°C to 30°C | Excitation Source | Tube voltage 5 to 50kV <br/> Tube current 0 to 1000uA |
| Sample Introduction System | 9 sample chambers (with cup rotation) <br/>12 sample chambers + single chamber <br/> 20 sample chambers + single chamber (optional) <br/>controlled by PLC | High Voltage Generator | Imported Spellman High Voltage |
| Testing Atmosphere | Atmospheric, Vacuum, Helium | Matrix Effect Correction Model | Mutually independent |
| Regression Program | Multivariate nonlinear regression program | Power Supply | AC 220V ± 5V |
| Sample Chamber Size | Φ340 × 64 (H) mm | Dimension | 646 × 578 × 388 mm |
| Weight | 85 Kg |
Features & Applications
Key Features
Energy-Dispersive
Dual-gas Path Switching
High Resolution
Suitable for RoHS/ELV compliance
Auto sample loading
Intelligent automatic detection
Siemens PLC control
Applications
Product Details