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PRODUCT INFORMATION
Overview
<span style="color:black;">X-ray Fluorescence Spectrometer LT-XRF102 Micro-area XRF Analyzer for fast non-destructive testing of coating thickness and composition. The multi-layer coating delivers stable signals with a 140 Ev resolution Fast-SDD detector and a high-power X-ray tube. It can detect 24 elements simultaneously, measuring from 0.005 to 50 μm, covering the range from 3Li to 92U with content from 0.1 to 99.99 %. To position tiny samples exactly a CCD camera with 25x zoom, laser focusing and an automatic XY stage are used. Operators are protected by safety interlocks.</span>
Technical Specifications
| Analytical method | Energy Dispersive X- ray Fluorescence Analysis Method combining FP and EC Methods | Coating measurement range | 3Li to 92U |
|---|---|---|---|
| Element detection range | 13Al to 92U | Elements measured at once | 24 (more than 5 coatings) |
| Detection limit | 0.005 µm (thinnest metal coating) | Thickness range | Generally within 50 µm (varies by material) |
| Thickness standard deviation | RSD < 3% | Content test range | 0.1% to 99.99% |
| Content accuracy | 0.5% | Content stability | Repeatability up to 0.5% |
| Detection time | 5 to 40 seconds | Detector | 25 mm² Be-window Fast-SDD, resolution 140 ± 5 eV |
| X-ray device | 50 kV / 1000 µA, W target, high-power high-voltage unit | Multichannel analyzer | DMCA digital, 4096 channels |
| Collimator | Optional 0.1 x 0.3 mm, Ø0.2, Ø0.3, Ø0.5 mm and others | Minimum test area | 0.02 mm² |
| Sample observation | CCD color camera, up to 25x magnification | Sample platform | Fully automatic multi-point XY platform |
| Z-axis lifting range | 0 to 140 mm | Focus | Laser height adjustment with variable camera focus |
| Dimensions (W x D x H) | 485 x 588 x 505 mm | Sample chamber (W x D x H) | 430 x 400 x 140 mm |
| Ambient conditions | 15 to 30 °C, ≤70% humidity | Power supply | AC 220 V ± 5 V (a purified regulated supply is recommended) |
| Weight | 60 kg |
PRODUCT DETAILS
Features & Applications
PRODUCT BENEFITS
Key Features
High Resolution detector
Micro area testing
Precise positioning
Multi-point testing
Wide measuring range
Safe operation and sleek design
WHERE IT IS USED
Applications
Electroplating industry
Electronics and communication
Automobile manufacturing
Magnetic materials
New energy and aerospace
PRODUCT INFORMATION
Product Details
X-RAY FLUORESCENCE SPECTROMETER